Signal Generator
Signal Generations, Arbitrary Waveform generation and Digital to Analog output modules for providing signal simulation capability Request A Quote |
-
Overview
-
Models
-
Manuals
-
Data Sheets
-
Software
-
Drivers
-
Videos
The EX1200-1538 is a high-performance multifunction card that provides 8-channels of independent 32-bit counters, 16 channels of isolated digital I/O, and 2 channels of isolated analog output (DAC) on a single card. The wide range of measurement functions make this card suitable for both electronic functional test, as well as precision data acquisition applications. Combining the EX1200-1538 with the DMM and switch capabilities allows for a complete measurement, control, and distribution system in a small 1U rack space. Counter channels accept both analog and digital inputs ranging from ±48 V of true differential voltages which makes it suitable to use with almost any real world signal without the need for external signal conditioning. Programmable hysteresis and threshold levels over the entire input voltage range can help to extract the fundamental frequency from the noisiest analog input signals. Electronic counter channels can directly measure the RPM from tooth wheel and other types of sensors. The EX1200-1538 isolated digital I/O channels can be configured as input or output on a per channel basis. Each channel is isolated from each other and can accept voltages from 2.5 V to 60 V. The output channels use solid-state switches that work in any polarity. The isolated analog output channels are independently configurable as either constant voltage or current mode. The output range is fixed (±10 V in voltage mode and ±20 mA in current mode) and the output levels are programmable with 16-bit resolution. Both channels are isolated from each other and fully protected, providing the capability to be connected in series or parallel for an even wider output range.
The EX1200-3608 and EX1200-3604 provide eight or four independent channels, respectively, of a digital to analog converter (DAC) with 16 bits of resolution. Each channel consists of a 16-bit DAC combined with a low-pass filter and an output amplifier. The 16-bit DAC allows these modules to achieve fine resolution at very low output range settings. Along with static output operation, the DAC modules provide an arbitrary waveform generation (AWG) mode which supports looping to build complex waveforms without the system controller’s intervention. The data may be paced out of the instrument by using either a user-supplied clock or the internal programmable timer with output rates up to 500 kSa/s. Each channel is true-differential, and has sense lines that can be used to compensate for voltage drops that occur over the length of the lead wire. When used in an EX1200 series mainframe with the optional DMM, the DAC outputs can be routed to the internal analog backplane for verification prior to critical test runs to ensure the device will perform to a high degree of accuracy. All channel outputs on these modules are individually isolated from system ground. This provides the ability to connect channels together in series to create an output channel with an extended range to 160 V or in parallel to create an output channel with a range of 160 mA. When using the EX1200 scanning measurement feature, the DAC levels can be programmed at the beginning of each scan step. This powerful feature provides the basis for test sequencing completely independent of the host controller, where analog outputs are synchronized with measurement inputs.
The EX1200-3608 and EX1200-3604 provide eight or four independent channels, respectively, of a digital to analog converter (DAC) with 16 bits of resolution. Each channel consists of a 16-bit DAC combined with a low-pass filter and an output amplifier. The 16-bit DAC allows these modules to achieve fine resolution at very low output range settings. Along with static output operation, the DAC modules provide an arbitrary waveform generation (AWG) mode which supports looping to build complex waveforms without the system controller’s intervention. The data may be paced out of the instrument by using either a user-supplied clock or the internal programmable timer with output rates up to 500 kSa/s. Each channel is true-differential, and has sense lines that can be used to compensate for voltage drops that occur over the length of the lead wire. When used in an EX1200 series mainframe with the optional DMM, the DAC outputs can be routed to the internal analog backplane for verification prior to critical test runs to ensure the device will perform to a high degree of accuracy. All channel outputs on these modules are individually isolated from system ground. This provides the ability to connect channels together in series to create an output channel with an extended range to 160 V or in parallel to create an output channel with a range of 160 mA. When using the EX1200 scanning measurement feature, the DAC levels can be programmed at the beginning of each scan step. This powerful feature provides the basis for test sequencing completely independent of the host controller, where analog outputs are synchronized with measurement inputs.
EX1200-1538 | Multifunction I/O Card with Enhanced Electronic Counter |
EX1200-3604 | 4 Channel, 500 kSa/s DAC/AWG |
EX1200-3608 | 8 Channel, 500 kSa/s DAC/AWG |
EX1200 Series Product Manual - 82-0127-000 (Rev:16/JUL)
EX1200-1538.pdf Product Manual - 82-0127-007 (Rev:April 2020)
EX1200-3604 / 3608 Product Manual - 82-0127-003 (rev 6.11.20)
VTEX Scanner Driver Product Manual - 82-0128-000 (Rev:10/JUL)
VTEX System Driver Product Manual - 82-0125-000 (Rev:10/JUL)
Title
Document
Download
EX1200 Series Product Manual - 82-0127-000 (Rev:16/JUL)
DocumentEX1200 Series Product Manual - 82-0127-000 (Rev:16/JUL)
EX1200-1538.pdf Product Manual - 82-0127-007 (Rev:April 2020)
DocumentEX1200-1538.pdf Product Manual - 82-0127-007 (Rev:April 2020)
EX1200-3604 / 3608 Product Manual - 82-0127-003 (rev 6.11.20)
DocumentEX1200-3604 / 3608 Product Manual - 82-0127-003 (rev 6.11.20)
VTEX Scanner Driver Product Manual - 82-0128-000 (Rev:10/JUL)
DocumentVTEX Scanner Driver Product Manual - 82-0128-000 (Rev:10/JUL)
VTEX System Driver Product Manual - 82-0125-000 (Rev:10/JUL)
DocumentVTEX System Driver Product Manual - 82-0125-000 (Rev:10/JUL)
Common - Linux C++ Driver (Rev:3.12.19)
Function Generator - IVI DRIVER - 72-0287-000
Function Generator - IVI DRIVER 64 Bit - 72-0287-100
Function Generator - LabVIEW Driver
VTEXFgen C++ Driver, 64-bit Linux, p/n 72-0302-100 (Rev: 3.13.12)
VTEXFgen C++ Driver, 32-bit Linux, p/n 72-0302-000 (Rev: 3.12.3)
Title
Document
Download
Function Generator - IVI DRIVER - 72-0287-000
DocumentFunction Generator - IVI DRIVER - 72-0287-000
Function Generator - IVI DRIVER 64 Bit - 72-0287-100
DocumentFunction Generator - IVI DRIVER 64 Bit - 72-0287-100
VTEXFgen C++ Driver, 32-bit Linux, p/n 72-0302-000 (Rev: 3.12.3)
DocumentVTEXFgen IVI Driver, 32-bit Linux, p/n 72-0302-000 (Rev: 3.12.3)